| ‘‘‘‘‘‘‘‘‘‘‘‘‘‘‘‘‘‘‘‘ KAWASAKI STEEL TECHNICAL REPORT No.22 ( May 1990 ) Advanced Technologies of Iron and Steel, Commemorating the 20th Anniversary of the Technical Research Division ‘‘‘‘‘‘‘‘‘‘‘‘‘‘‘‘‘‘‘‘ |
| Thin Film X-Ray Diffraction Method Using Vacuum Pass Line Michio Katayama, Masato Shimizu, Tizuko Maeda |
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Synopsis : A new type of X-ray diffractometer for ultra-thin-film, applicable in vacuum, has been developed. This analysis method has made it possible to increase peak intensity of diffraction measured in vacuum in comparison with in air, resulting in successful detection of an ultra-thin film less than 10 nm in thickness. Its application to the surface film analysis revealed that (1) the thickness of FeCr2O4 film formed on AISI 304 stainless steel during bright annealing increased rapidly when the dew point exceeded -40, and (2) crystallization temperature of amorphous metal of the Fe-B-Si system depended upon the annealing atmosphere and crystallization started at the surface. |
| TextiPDF: 7p./281kbj |